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Dissertation

Infrarood- en ultramicroscopie in silicium
Authors: Engelen, Joris --- Rijksuniversiteit Gent.
Year: 1966

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Silicium.

Dissertation

Ellipsometrische studie van anodisch gegroeide oxydelaagjes op p-type silicium
Authors: Vekeman, Guy --- Rijksuniversiteit Gent.
Year: 1981

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Silicium.

Dissertation

Karakterisatie van zuurstofprecipitaten in silicium met FT-IR spectroscopie
Authors: De Gryse, Olivier --- Universiteit Gent.
Year: 1996

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Silicium. --- Spectroscopie.

Dissertation

Oplosbaarheid van koper in silicium
Authors: Lemeur, Raoul --- Rijksuniversiteit Gent.
Year: 1965

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Koper. --- Silicium.

Dissertation

Het groeien van dislocatie- en zuurstofvrije silicium eenkristallen
Authors: Hus, Jozef --- Rijksuniversiteit Gent.
Year: 1964

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Eenkristallen. --- Silicium.

Dissertation

Precipitatiegedrag van goud, aluminium en nikkel in silicium eenkristallen
Authors: Cornelis, Etienne --- Rijksuniversiteit Gent.
Year: 1966

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Eenkristallen. --- Silicium.

Dissertation

De studie van nikkelprecipitaten in silicium eenkristallen
Authors: Jacobsen, Guy --- Rijksuniversiteit Gent.
Year: 1968

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Eenkristallen. --- Silicium.

Dissertation

Studie van de anodische oxydatie van p-type silicium in methanol met behulp van ellipsometrie
Authors: Willem, Dirk --- Rijksuniversiteit Gent.
Year: 1983

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Ellipsometrie. --- Silicium.

Dissertation

Het rechtstreeks waarnemen van dislocaties in silicium
Authors: Fiermans, Lucien --- Rijksuniversiteit Gent.
Year: 1965

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Dislocaties. --- Silicium.

Dissertation

Etude du silicium amorphe hydrogène et de ses dérivés nitrures : application à la réalisation de capteurs d'images
Author: Chaussat, Christophe
Year: 1984 Publisher: Grenoble : Institut National Polytechnique de Grenoble,

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Nitrure de silicium --- Silicium amorphe

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